Analysis of the Conditions for Worst Case Switching Activity in Integrated Circuits

AuthID
 P-00K-EER
3
Author(s)
Sampaio, C
·
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in Proceedings - 2010 1st IEEE Latin American Symposium on Circuits and Systems, LASCAS 2010
Páginas: 117-120
Conference
1St Ieee Latin American Symposium on Circuits and Systems, Lascas 2010, Date: 24 February 2010 through 26 February 2010, Patrocinadores: Brazillian Computer Society (SBC);Brazillian Microelectronics Society (SBMicro);IEEE;IEEE Circuits and Systems Society (CASS)
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SCOPUS: 2-s2.0-84964872480
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