Measurement of Sensitivity Improvement in Rfid Tags

AuthID
 P-00K-V2Z
2
Author(s)
Carvalho, NB
Tipo de Documento
Proceedings Paper
Year published
2016
Publicado
in 2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Volume: 2016-August
Conference
Ieee Mtt-S International Microwave Symposium (Ims), Date: MAY 22-27, 2016, Location: San Francisco, CA, Patrocinadores: IEEE
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Publication Identifiers
SCOPUS: 2-s2.0-84984945100
Wos: WOS:000390313200268
Source Identifiers
ISSN: 0149-645X
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