High Immunity Wafer-Level Measurement of Mhz Current

AuthID
 P-00M-BR3
6
Author(s)
Dabek, M
·
Kalabinski, P
·
Wrona, J
·
Cardoso, S
·
Freitas, PP
Document Type
Article
Year published
2016
Published
in MEASUREMENT, ISSN: 0263-2241
Volume: 94, Pages: 474-479 (6)
Indexing
Wos®
Google Scholar®
Publication Identifiers
Wos: WOS:000390512100053
Source Identifiers
ISSN: 0263-2241
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service