Quantification of In-Contact Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy

AuthID
 P-00M-E4A
7
Author(s)
Jesse, S
·
Carmichael, B
·
Kravchenko, II
·
Tipo de Documento
Article
Year published
2017
Publicado
in NANOTECHNOLOGY, ISSN: 0957-4484
Volume: 28, Número: 6
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Publication Identifiers
SCOPUS: 2-s2.0-85010224324
Wos: WOS:000392217400001
Source Identifiers
ISSN: 0957-4484
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