Relationship Between Nano-Architectured Ti1-X Cu (X) Thin Film and Electrical Resistivity for Resistance Temperature Detectors

AuthID
 P-00M-NBJ
6
Author(s)
Document Type
Article
Year published
2017
Published
in JOURNAL OF MATERIALS SCIENCE, ISSN: 0022-2461
Volume: 52, Issue: 9, Pages: 4878-4885 (8)
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Publication Identifiers
Wos: WOS:000395105500009
Source Identifiers
ISSN: 0022-2461
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