Satisfiability-Based Functional Delay Fault Testing

AuthID
 P-00M-WDA
3
Author(s)
Kim, Joonyoung
·
Sakallah, KaremA.
3
Editor(s)
L. Miguel Silveira; Srinivas Devadas; Ricardo Augusto da Luz Reis
Document Type
Proceedings Paper
Year published
1999
Published
in VLSI: Systems on a Chip, IFIP TC10/WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI '99), December 1-4, 1999, Lisbon, Portugal in IFIP Conference Proceedings
Volume: 162, Pages: 362-372
Indexing
Dblp®/pt/publications/view/684458
Publication Identifiers
Dblp: conf/ifip10-5/KimSS99
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service