A New Nonlinear Behavioral Modeling Technique for Rf Power Transistors Based on Bayesian Inference

AuthID
 P-00N-609
3
Author(s)
Cai, J
·
King, J
·
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in IEEE MTT-S International Microwave Symposium Digest, ISSN: 0149-645X
Páginas: 624-626
Conference
2017 Ieee Mtt-S International Microwave Symposium, Ims 2017, Date: 4 June 2017 through 9 June 2017
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Publication Identifiers
SCOPUS: 2-s2.0-85032499884
Source Identifiers
ISSN: 0149-645X
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