Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Click on the image)
Autenticação local
Recuperação de Password
Register
Entrar
Publicações
Procurar
Estatísticas
Electronic and Dynamical Properties of the Silicon Trivacancy
AuthID
P-002-43Z
9
Author(s)
Coutinho, J
·
Markevich, VP
·
Peaker, AR
·
Hamilton, B
·
Lastovskii, SB
·
Murin, LI
·
Svensson, BJ
·
Rayson, MJ
·
Briddon, PR
Document Type
Article
Year published
2012
Published
in
PHYSICAL REVIEW B,
ISSN: 1098-0121
Volume: 86, Issue: 17
Indexing
Wos
®
Scopus
®
Crossref
®
26
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1103/physrevb.86.174101
Scopus
: 2-s2.0-84869020505
Wos
: WOS:000310499600001
Source Identifiers
ISSN
: 1098-0121
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Lista
Marked
Adicionar à lista
Marked
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service