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From System Level to Defect-Oriented Test: A Case Study
AuthID
P-00N-G46
5
Author(s)
Dias, OP
·
Semião, J
·
Santos, MB
·
Teixeira, IM
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
1999
Published
in
Proceedings - European Test Workshop 1999, ETW 1999
Pages: 136-141
Conference
1999 European Test Workshop, Etw 1999,
Date:
25 May 1999 through 28 May 1999,
Sponsors:
IEEE Computer Society;University of Stuttgart
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Publication Identifiers
DOI
:
10.1109/etw.1999.804509
Scopus
: 2-s2.0-85040087919
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