Detection of Ijtag Attacks Using Ldpc-Based Feature Reduction and Machine Learning

AuthID
 P-00N-ZX5
3
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2018
Publicado
in 2018 23RD IEEE EUROPEAN TEST SYMPOSIUM (ETS) in Proceedings of the European Test Symposium, ISSN: 1530-1877
Volume: 2018-May, Páginas: 1-6 (6)
Conference
23Rd Ieee European Test Symposium (Ets), Date: MAY 28-JUN 01, 2018, Location: Bremen, GERMANY, Patrocinadores: IEEE, Univ Bremen, German Res Ctr Artificial Intelligence, IEEE Council Elect Design Automat, Advantest, ARM, Bosch, Cadence, Infineon, Intel, Mentor, Qualcomm, Ridgetop Europe nv, TTTC, DFG
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Publication Identifiers
SCOPUS: 2-s2.0-85049985891
Wos: WOS:000440131500001
Source Identifiers
ISSN: 1530-1877
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