in PROCEEDINGS OF THE 13TH IEEE SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS in IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, ISSN: 2334-3133
Páginas: 72-77 (6)
Conference
13Th Ieee Symposium on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 14-16, 2010, Location: Vienna, AUSTRIA, Patrocinadores: IEEE, IEEE Comp Soc, Test Technol Tech Council, Vienna Univ Technol, Fac Informat, Dept Comp Engn, RUAG Space GmbH
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