Pavese, F; Bar, M; Filtz, JR; Forbes, AB; Pendrill, L; Shirono, K
Tipo de Documento
Proceedings Paper
Year published
2012
Publicado
in ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING IX in Series on Advances in Mathematics for Applied Sciences, ISSN: 1793-0901
Volume: 84, Páginas: 377-384 (8)
Conference
9Th Conference on Advanced Mathematical and Computational Tool in Metrology and Testing (Amc Tm), Date: JUN 20-22, 2011, Location: Gothenberg, SWEDEN, Patrocinadores: IMEKO TC 21, SP, Chalmers Univ
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