Multi-Dimensional Modelling of Electrostatic Forces Between Atomic Force Microscopy Tip and Dielectric Surface

AuthID
 P-00P-8R0
5
Author(s)
Boularas, A
·
Baudoin, F
·
Teyssedre, G
·
Villeneuve Faure, C
·
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in PROCEEDINGS OF THE 2013 IEEE INTERNATIONAL CONFERENCE ON SOLID DIELECTRICS (ICSD 2013), VOLS 1 AND 2 in IEEE International Conference on Solid Dielectrics-ICSD, ISSN: 1553-5282
Páginas: 1040-1043 (4)
Conference
11Th Ieee International Conference on Solid Dielectrics (Icsd), Date: JUN 30-JUL 04, 2013, Location: Bologna, ITALY, Patrocinadores: IEEE, IEEE Dielectr & Elect Insulat Soc, Univ Bologna, Dept Elect, Elect & Informat Engn, Lab Innovat Technol, Dow Inside, TECHMP
Indexing
Wos®
Publication Identifiers
Wos: WOS:000339117400244
Source Identifiers
ISSN: 1553-5282
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2025 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service