Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits

AuthID
 P-002-7A5
6
Author(s)
Rodriguez Andina, JJ
·
Document Type
Article
Year published
2012
Published
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 28, Issue: 4, Pages: 421-434 (14)
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Publication Identifiers
Scopus: 2-s2.0-84867231291
Wos: WOS:000308364300004
Source Identifiers
ISSN: 0923-8174
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