Live Demonstration: An Automated Test Bench for an 130Nm Sc Dc-Dc Converter

AuthID
 P-00P-YE6
4
Author(s)
Madeira, R
·
Paulino, N
Tipo de Documento
Proceedings Paper
Year published
2018
Publicado
in Proceedings - IEEE International Symposium on Circuits and Systems, ISSN: 0271-4310
Volume: 2018-May
Conference
2018 Ieee International Symposium on Circuits and Systems, Iscas 2018, Date: 27 May 2018 through 30 May 2018, Patrocinadores: IEEE;IEEE Circuits and Systems (CAS) Society
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Publication Identifiers
SCOPUS: 2-s2.0-85057135619
Source Identifiers
ISSN: 0271-4310
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