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A Simple Method to Extract Trapping Time Constants of Gan Hemts
AuthID
P-00P-Z65
4
Author(s)
Nunes, LC
·
Gomes, JL
·
Cabral, PM
·
Pedro, JC
Document Type
Proceedings Paper
Year published
2018
Published
in
2018 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM - IMS
in
IEEE MTT-S International Microwave Symposium,
ISSN: 0149-645X
Pages: 716-719 (4)
Conference
Ieee/Mtt-S International Microwave Symposium,
Date:
JUN 10-15, 2018,
Location:
Philadelphia, PA,
Sponsors:
IEEE, MTT-S, RFIC, ARFTG, IMBIoC, IMS
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