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Investigation of Generation of Defects Due to Metallization on Cdznte Detectors
AuthID
P-002-A5J
11
Author(s)
Zheng, Q
·
Dierre, F
·
Franc, J
·
Crocco, J
·
Bensalah, H
·
Corregidor, V
·
Alves, E
·
Ruiz, E
·
Vela, O
·
Perez, JM
·
Dieguez, E
Document Type
Article
Year published
2012
Published
in
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
ISSN: 0022-3727
Volume: 45, Issue: 17, Pages: 175102 (6)
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Publication Identifiers
DOI
:
10.1088/0022-3727/45/17/175102
Scopus
: 2-s2.0-84859779949
Wos
: WOS:000303538000005
Source Identifiers
ISSN
: 0022-3727
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