The Influence of Clock-Gating On Nbti-Induced Delay Degradation

AuthID
 P-002-EGP
6
Author(s)
Pachito, J
·
Martins, CV
·
Tipo de Documento
Proceedings Paper
Year published
2012
Publicado
in 2012 IEEE 18TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS) in IEEE International On-Line Testing Symposium, ISSN: 1942-9398
Páginas: 61-66 (6)
Conference
Ieee 18Th International On-Line Testing Symposium (Iolts), Date: JUN 27-29, 2012, Location: Sitges, SPAIN, Patrocinadores: IEEE, IEEE Comp Soc, IEEE Comp Soc Test Technol Tech Council (TTTC), Univ Politecnica Catalunya, Univ Athens, TIMA Lab
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Publication Identifiers
SCOPUS: 2-s2.0-84869201850
Wos: WOS:000312722700011
Source Identifiers
ISSN: 1942-9398
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