Publicações

Yield Analysis for Electrical Circuit Designs: Many Problems and Some Recent Developments in Electronic Engineering

AuthID
P-00R-PEB

Author(s)

Weber, S

Duarte, C

Tipo de Documento

Article

Year published

2020

Publicado

in IEEE Solid-State Circuits Magazine, ISSN: 1943-0582

Volume: 12, Número: 1, Páginas: 39-52

Indexing

Scopus^®

Crossref^®

Google Scholar^®

Publication Identifiers

DOI: 10.1109/mssc.2019.2939341

SCOPUS: 2-s2.0-85078735072

Source Identifiers

ISSN: 1943-0582

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Citações

Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference

No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors

Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Full Text

Full Text @ sfx.b-on.pt

Yield Analysis for Electrical Circuit Designs: Many Problems and Some Recent Developments in Electronic Engineering

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

Yield Analysis for Electrical Circuit Designs: Many Problems and Some Recent Developments in Electronic Engineering

Links Úteis

Ajuda