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Electronic and Phonon Instabilities in Bilayer Graphene Under Applied External Bias
AuthID
P-00R-RD8
7
Author(s)
Silva, EL
·
Santos, MC
·
Skelton, JM
·
Yang, T
·
Santos, T
·
Parker, SC
·
Walsh, A
Document Type
Proceedings Paper
Year published
2020
Published
in
MATERIALS TODAY-PROCEEDINGS,
ISSN: 2214-7853
Volume: 20, Pages: 373-382 (10)
Conference
11Th International Conference on Advanced Nanomaterials (Anm),
Date:
JUL 18-20, 2018,
Location:
Univ Aveiro, Aveiro, PORTUGAL,
Host:
Univ Aveiro
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: WOS:000512898100018
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ISSN
: 2214-7853
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