Fault-Tolerant Design of Three-Phase Dual-Buck Vsi Topologies

AuthID
P-00S-1D2
Document Type
Proceedings Paper
Year published
2019
Published
in 45TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2019) in IEEE Industrial Electronics Society, ISSN: 1553-572X
Pages: 4630-4635 (6)
Conference
45Th Annual Conference of the Ieee Industrial Electronics Society (Iecon), Date: OCT 14-17, 2019, Location: Lisbon, PORTUGAL, Sponsors: IEEE, Univ Nova Lisboa, IEEE Ind Elect Soc
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Publication Identifiers
Wos: WOS:000522050604101
Source Identifiers
ISSN: 1553-572X
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