Fault-Tolerant Design of Three-Phase Dual-Buck Vsi Topologies

AuthID
 P-00S-2B4
3
Author(s)
Document Type
Proceedings Paper
Year published
2019
Published
in IECON Proceedings (Industrial Electronics Conference)
Volume: 2019-October, Pages: 4630-4635
Conference
45Th Annual Conference of the Ieee Industrial Electronics Society, Iecon 2019, Date: 14 October 2019 through 17 October 2019, Sponsors: IEEE;IEEE Industrial Electronics Society (IES)
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Publication Identifiers
Scopus: 2-s2.0-85083979894
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