Publicações

Compositional Analysis by Rbs, Xps and Edx of Zno:al,Bi and Zno:ga,Bi Thin Films Deposited by D.c. Magnetron Sputtering (Vol 161, Pg 268, 2019)

AuthID
P-00S-ER2

Author(s)

Ribeiro, JM

Correia, FC

Salvador, PB

Rebouta, L

Mendes, A

Tipo de Documento

Correction

Year published

2020

Publicado

in VACUUM, ISSN: 0042-207X

Volume: 180

Indexing

Wos^®

Scopus^®

Google Scholar^®

Publication Identifiers

DOI: 10.1016/j.vacuum.2020.109608

SCOPUS: 2-s2.0-85087622917

Wos: WOS:000566762900003

Source Identifiers

ISSN: 0042-207X

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Compositional Analysis by Rbs, Xps and Edx of Zno:al,Bi and Zno:ga,Bi Thin Films Deposited by D.c. Magnetron Sputtering (Vol 161, Pg 268, 2019)

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Compositional Analysis by Rbs, Xps and Edx of Zno:al,Bi and Zno:ga,Bi Thin Films Deposited by D.c. Magnetron Sputtering (Vol 161, Pg 268, 2019)

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