Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Click on the image)
Autenticação local
Recuperação de Password
Register
Entrar
Publicações
Procurar
Estatísticas
Orientation Dependence of Electrical Properties of Polycrystalline Cu2O Thin Films
AuthID
P-00S-FJP
7
Author(s)
Tiberio, M
·
Calmeiro, T
·
Nandy, S
·
Nunes, D
·
Martins, R
·
Fortunato, E
·
Deuermeier, J
Document Type
Article
Year published
2020
Published
in
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
ISSN: 0268-1242
Volume: 35, Issue: 7
Indexing
Wos
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1088/1361-6641/ab883b
Wos
: WOS:000548345300001
Source Identifiers
ISSN
: 0268-1242
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Lista
Marked
Adicionar à lista
Marked
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service