Near-Field Microwave Microscopy: Subsurface Imaging for In Situ Characterization

AuthID
 P-00S-RD7
1
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Tipo de Documento
Article
Year published
2020
Publicado
in IEEE MICROWAVE MAGAZINE, ISSN: 1527-3342
Volume: 21, Número: 10, Páginas: 72-86 (15)
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SCOPUS: 2-s2.0-85091232776
Wos: WOS:000568655100001
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ISSN: 1527-3342
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