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Ingan Epilayer Characterization by Microfocused X-Ray Reciprocal Space Mapping
AuthID
P-002-KDM
6
Author(s)
Kachkanov, V
·
Dolbnya, IP
·
O'Donnell, KP
·
Martin, RW
·
Edwards, PR
·
Pereira, S
Document Type
Article
Year published
2011
Published
in
APPLIED PHYSICS LETTERS,
ISSN: 0003-6951
Volume: 99, Issue: 18, Pages: 181909 (3)
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Scopus
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Metadata
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Publication Identifiers
DOI
:
10.1063/1.3658619
Scopus
: 2-s2.0-80855141616
Wos
: WOS:000296659400040
Source Identifiers
ISSN
: 0003-6951
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