Ballistic Electron Emission Microscopy Studies of Znse-Bete Heterojunctions

AuthID
 P-00T-P34
8
Author(s)
Fink, V
·
Kavanagh, KL
·
Lu, RP
·
Hansen, L
·
Becker, CR
·
Molenkamp, LW
1
Editor(es)
Aspnes,DE
Tipo de Documento
Proceedings Paper
Year published
2002
Publicado
in Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, ISSN: 1071-1023
Volume: 20, Número: 4, Páginas: 1781-1789
Conference
Proceedings of the 29Th Conference on the Physics and Chemistry of Semiconductor Interfaces, Date: 6 January 2002 through 10 January 2002, Location: Santa Fe, NM, Patrocinadores: AVS;the Army Research Office;the Office of Naval Research
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Publication Identifiers
SCOPUS: 2-s2.0-0035982623
Source Identifiers
ISSN: 1071-1023
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