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Fault Diagnosis Based on Black-Box Models with Application to a Liquid-Level System
AuthID
P-000-JKD
3
Author(s)
Palma, LB
·
Coito, FV
·
Silva, RN
Document Type
Proceedings Paper
Year published
2003
Published
in
ETFA 2003: IEEE CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION, VOL 2, PROCEEDINGS,
ISSN: 1946-0740
Volume: 2, Issue: January, Pages: 739-746 (8)
Conference
9Th Ieee International Conference on Emerging Technologies and Factory Automation,
Date:
SEP 16-19, 2003,
Location:
Lisbon, PORTUGAL,
Sponsors:
IEEE Ind Elect Soc, UNINOVA, Univ Nova Lisboa FCT DEE,
Host:
Calouste Gulbenkian Fdn
Indexing
Wos
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Scopus
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Metadata
Sources
Publication Identifiers
DOI
:
10.1109/etfa.2003.1248772
Scopus
: 2-s2.0-38149069208
Wos
: WOS:000189414100111
Source Identifiers
ISSN
: 1946-0740
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