Papr Deviation Impact in the Wideband Power Amplifier Characterization with Realistic Modulated Load-Pull System

AuthID
 P-00V-PCE
5
Author(s)
Chaudhary, S
·
Vanden Bossche, M
·
Cooman, A
Tipo de Documento
Proceedings Paper
Year published
2021
Publicado
in 2021 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Volume: 2021-June, Páginas: 562-565 (4)
Conference
Ieee Mtt-S International Microwave Symposium (Ims), Date: JUN 07-25, 2021, Location: ELECTR NETWORK, Patrocinadores: IEEE MTT S,IEEE,RFIC,ARFT G,Analog Devices,Qorvo,Keysight Technologies,ROHDE & SCHWARZ,Wolfspeed,Apitech,Cadence,Copper Mountain Technologies,Eravant,MACOM,Mini Circuits,NIC,Samtec
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Publication Identifiers
SCOPUS: 2-s2.0-85118545363
Wos: WOS:000852934400150
Source Identifiers
ISSN: 0149-645X
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