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Detection and Characterization of Defects Using Gmr Probes and Artificial Neural Networks
AuthID
P-002-VFF
3
Author(s)
Postolache, O
·
Ramos, HG
·
Ribeiro, AL
Document Type
Article
Year published
2011
Published
in
COMPUTER STANDARDS & INTERFACES,
ISSN: 0920-5489
Volume: 33, Issue: 2, Pages: 191-200 (10)
Conference
16Th Symposium on Imeko Tc-4/ 13Th International Workshop on Adc Modelling and Testing,
Date:
SEP 22-24, 2008,
Location:
Florence, ITALY
Indexing
Wos
®
Scopus
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Crossref
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26
Google Scholar
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Metadata
Sources
Publication Identifiers
DOI
:
10.1016/j.csi.2010.06.011
Scopus
: 2-s2.0-78649980439
Wos
: WOS:000285947000012
Source Identifiers
ISSN
: 0920-5489
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