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Optical and Structural Study of Ge/Si Quantum Dots on Si(100) Surface Covered with a Thin Silicon Oxide Layer

AuthID
P-000-030

Author(s)

Fonseca, A

Nikiforov, AI

Tipo de Documento

Article

Year published

2005

Publicado

in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107

Volume: 124, Número: SUPPL., Páginas: 462-465 (4)

Conference

Symposium on Materials Science and Device Issues for Futrue Si-Based Technologies Held at the 2005 Emrs Meeting, Date: MAY 31-JUN 03, 2005, Location: Strasbourg, FRANCE, Patrocinadores: European Mat Res Soc

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Publication Identifiers

DOI: 10.1016/j.mseb.2005.08.046

SCOPUS: 2-s2.0-27844461924

Wos: WOS:000233895800096

Source Identifiers

ISSN: 0921-5107

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Optical and Structural Study of Ge/Si Quantum Dots on Si(100) Surface Covered with a Thin Silicon Oxide Layer

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Optical and Structural Study of Ge/Si Quantum Dots on Si(100) Surface Covered with a Thin Silicon Oxide Layer

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