Toggle navigation
Publicações
Investigadores
Instituições
0
Entrar
Autenticação Federada
(Click on the image)
Autenticação local
Recuperação de Password
Register
Entrar
Publicações
Procurar
Estatísticas
Modeling Temperature Dynamic Effects for High-Power Light-Emitting Diodes
AuthID
P-00X-NHM
5
Author(s)
Kyatam, S
·
Rodrigues, L
·
Alves, LN
·
Maslovski, SI
·
Mendes, JC
Document Type
Article in Press
Year published
2022
Published
in
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS,
ISSN: 0098-9886
Indexing
Wos
®
Scopus
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1002/cta.3496
Scopus
: 2-s2.0-85144178022
Wos
: WOS:000899175400001
Source Identifiers
ISSN
: 0098-9886
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Lista
Marked
Adicionar à lista
Marked
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service