Publicações

Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing

AuthID
P-00X-P59

Author(s)

Silva, AR

Vaz, M

Leite, S

Mendes, J

Tipo de Documento

Article

Year published

2023

Publicado

in SENSORS, ISSN: 14248220

Volume: 23, Número: 1, Páginas: 325 (22)

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Pubmed^®

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Publication Identifiers

DOI: 10.3390/s23010325

DBLP: journals/sensors/SilvaVLM23

Pubmed: 36616930

SCOPUS: 2-s2.0-85145972253

Unpaywall: 10.3390/s23010325

Wos: WOS:000910237700001

Source Identifiers

ISSN: 14248220

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Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing

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Lock-In Thermal Test Simulation, Influence, and Optimum Cycle Period for Infrared Thermal Testing in Non-Destructive Testing

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