Non-Destructive Banana Ripeness Detection Using Shallow and Deep Learning: A Systematic Review

AuthID
 P-00X-VDJ
6
Author(s)
Hayat, A
·
Mostafa, SS
·
Morgado-Dias, F
Document Type
Review
Year published
2023
Published
in SENSORS, ISSN: 1424-8220
Volume: 23, Issue: 2
Indexing
Wos®
Scopus®
Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 36679535
Scopus: 2-s2.0-85146713301
Wos: WOS:000916315800001
Source Identifiers
ISSN: 1424-8220
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas instituições

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service