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A Comprehensive Analysis of Electron Emission from A-Si:h/Al2O3 at Low Energies
AuthID
P-00X-XYX
8
Author(s)
Loffler, J
·
Belhaj, M
·
Bundaleski, N
·
Leon, JJD
·
Thomet, J
·
Frey, S
·
Ballif, C
·
Wyrsch, N
Document Type
Article
Year published
2023
Published
in
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
ISSN: 0022-3727
Volume: 56, Issue: 6
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Publication Identifiers
DOI
:
10.1088/1361-6463/acaf37
Wos
: WOS:000919868600001
Source Identifiers
ISSN
: 0022-3727
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