Test Pattern Generation for Width Compression in Bist

AuthID
 P-001-5VA
4
Author(s)
Chakrabarty, K
·
Document Type
Proceedings Paper
Year published
1999
Published
in ISCAS '99: PROCEEDINGS OF THE 1999 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, ISSN: 02714310
Volume: 1, Pages: 114-118 (5)
Conference
1999 Ieee International Symposium on Circuits and Systems (Iscas 99), Date: MAY 30-JUN 02, 1999, Location: ORLANDO, FL, Sponsors: IEEE
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Scopus®
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Publication Identifiers
Dblp: conf/iscas/FloresNCS99
Scopus: 2-s2.0-0032692708
Wos: WOS:000081715100028
Source Identifiers
ISSN: 02714310
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