Automatic Evaluation of Plasma Density Profiles from Microwave Reflectometry on Asdex Upgrade Based on the Time-Frequency Distribution of the Reflected Signals

AuthID
P-001-681
Document Type
Article
Year published
1999
Published
in REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN: 0034-6748
Volume: 70, Issue: 1, Pages: 1060-1063 (4)
Conference
12Th Topical Conference on High-Temperature Plasma Diagnostics, Date: JUN 07-11, 1998, Location: PRINCETON, NJ, Sponsors: Amer Phys Soc, Off Def Programs, US Dept Energy, Off Fus Energy, Princeton Plasma Phys Lab
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Publication Identifiers
SCOPUS: 2-s2.0-0001078104
Wos: WOS:000078278900214
Source Identifiers
ISSN: 0034-6748
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