P-Type Cuo(X) Thin Films by Rf-Plasma Enhanced Reactive Thermal Evaporation: Influence of Rf-Power Density

AuthID
 P-002-7AJ
5
Author(s)
Document Type
Article
Year published
2012
Published
in JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, ISSN: 1533-4880
Volume: 12, Issue: 8, Pages: 6754-6757 (4)
Conference
3Rd International Conference on Advanced Nano Materials (Anm), Date: SEP 12-15, 2010, Location: Agadir, MOROCCO
Indexing
Wos®
Scopus®
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Pubmed®
Google Scholar®
Publication Identifiers
Pubmed: 22962818
Scopus: 2-s2.0-84865131644
Wos: WOS:000308379900100
Source Identifiers
ISSN: 1533-4880
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