Induction Defectoscope Based on Uniform Eddy Current Probe with Gmrs

AuthID
P-003-DCZ
3
Author(s)
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 1278-1283 (6)
Conference
International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 03-06, 2010, Location: Austin, TX, Sponsors: IEEE
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Publication Identifiers
Scopus: 2-s2.0-77957832064
Wos: WOS:000287997200243
Source Identifiers
ISSN: 1091-5281
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