Modeling of Image Formation of a Low-Cost White-Light Bench Microscope with a Linear Cmos Image Sensor: Its Application in Metrology - Art. No. 66170A

AuthID
 P-004-DYM
4
Author(s)
3
Editor(s)
Bosse, H; Bodermann, B; Silver, RM
Document Type
Proceedings Paper
Year published
2007
Published
in Modeling Aspects in Optical Metrology in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), ISSN: 0277-786X
Volume: 6617, Pages: A6170-A6170 (10)
Conference
Conference on Modeling Aspects in Optical Metrology, Date: JUN 18-19, 2007, Location: Munich, GERMANY, Sponsors: SPIE Europe, European Opt Soc, Wissensch Gesell Lasertech e V
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-36248983280
Wos: WOS:000250109600008
Source Identifiers
ISSN: 0277-786X
Export Publication Metadata
Marked List
 Add to Marked List
Citations
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference
No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2026 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service