Toggle navigation
Publications
Researchers
Institutions
0
Sign In
Federated Authentication
(Click on the image)
Local Sign In
Password Recovery
Register
Sign In
Publications
Search
Statistics
Fault Analysis of Dual Active Bridge Converters
AuthID
P-005-41Q
3
Author(s)
Ribeiro, E
·
Marques Cardoso, AJM
·
Boccaletti, C
Document Type
Proceedings Paper
Year published
2012
Published
in
38TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2012)
in
IEEE Industrial Electronics Society,
ISSN: 1553-572X
Pages: 398-403 (6)
Conference
38Th Annual Conference on Ieee-Industrial-Electronics-Society (Iecon ),
Date:
OCT 25-28, 2012,
Location:
Montreal, CANADA,
Sponsors:
IEEE, IEEE Ind Elect Soc (IES),
Host:
Univ Quebec, Ecole Technologie Superieure Montreal (ETS)
Indexing
Wos
®
Scopus
®
Crossref
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/iecon.2012.6388787
SCOPUS
: 2-s2.0-84872907085
Wos
: WOS:000316962900061
Source Identifiers
ISSN
: 1553-572X
Export Publication Metadata
Export
×
Publication Export Settings
BibTex
EndNote
APA
Export Preview
Marked List
Add to Marked List
Info
At this moment we don't have any links to full text documens.
×
Select Source
This publication has:
2 records from
ISI
2 records from
SCOPUS
2 records from
DBLP
2 records from
Unpaywall
2 records from
Openlibrary
2 records from
Handle
Please select which records must be used by Authenticus!
×
Preview Publications
© 2024 CRACS & Inesc TEC - All Rights Reserved
Privacy Policy
|
Terms of Service