On-Chip Built-In Self-Test of Video-Rate Adcs Using a 1.5 v Cmos Gaussian Noise Generator

AuthID
 P-007-M40
3
Author(s)
Document Type
Proceedings Paper
Year published
2006
Published
in 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Pages: 669-672
Conference
2005 Ieee Conference on Electron Devices and Solid-State Circuits, Edssc, Date: 19 December 2005 through 21 December 2005, Location: Howloon, Sponsors: IEEE Electron Devices Society;IEEE Solid-State Circuits Society;IEEE Hong Kong Section;K. C. Wong Education Foundation;Solomon Systech Limited
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Scopus: 2-s2.0-43549094267
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