Ion Temperature and X-Ray Line Width Measurements of Highly Charged Argon Ions in an Ecr Ion Source

AuthID
 P-008-HSQ
7
Author(s)
Gumberidze, A
·
Attard, J
·
Indelicato, P
Document Type
Article
Year published
2013
Published
in PHYSICA SCRIPTA, ISSN: 0031-8949
Volume: T156, Pages: 014077 (3)
Conference
16Th International Conference on the Physics of Highly Charged Ions (Hci), Date: SEP 02-07, 2012, Location: Heidelberg, GERMANY, Sponsors: CAEN, Oerlikon Leybold Vacuum, RoentDek Handels, Struck Innovat Syst, Host: Ruprecht Karls Univ
Indexing
Wos®
Scopus®
Crossref®3
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84888635439
Wos: WOS:000329022300078
Source Identifiers
ISSN: 0031-8949
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2025 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service