Bottom-Up Testing Methodology for Vlsi.

AuthID
P-008-XJ3
6
Author(s)
Almeida, CFB
·
Gracio, JA
·
Bicudo, PA
·
Oliveira, AL
·
Rua, N
Document Type
Proceedings Paper
Year published
1988
Published
in Proceedings of the Custom Integrated Circuits Conference, ISSN: 0886-5930
Pages: 16.6/1-4
Conference
Proceedings of the Ieee 1988 Custom Integrated Circuits Conference., Location: Rochester, NY, USA, Sponsors: IEEE, Electron Devices Soc, New York, NY, USA;IEEE, Solid-State Circuits Council, New York, NY, USA;IEEE, Rochester Section, Rochester, NY, USA
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Publication Identifiers
SCOPUS: 2-s2.0-0024134202
Source Identifiers
ISSN: 0886-5930
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