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High Depth Resolution Rutherford Backscattering Analysis of Si-Si0.78Ge0.22/(0 0 1)Si Superlattices

AuthID
P-009-2V5

Author(s)

Barradas, NP

Jeynes, C

Mironov, OA

Phillips, PJ

Parker, EHC

Document Type

Article

Year published

1998

Published

in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X

Volume: 139, Issue: 1-4, Pages: 239-243 (5)

Conference

5Th European Conference on Accelerators in Applied Research and Technology (Ecaart5), Date: AUG 26-30, 1997, Location: EINDHOVEN, NETHERLANDS, Host: EINDHOVEN UNIV

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Publication Identifiers

DOI: 10.1016/s0168-583x(97)00965-8

Scopus: 2-s2.0-0032043003

Wos: WOS:000074586200036

Source Identifiers

ISSN: 0168-583X

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High Depth Resolution Rutherford Backscattering Analysis of Si-Si0.78Ge0.22/(0 0 1)Si Superlattices

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High Depth Resolution Rutherford Backscattering Analysis of Si-Si0.78Ge0.22/(0 0 1)Si Superlattices

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