Normal Incidence Imaging Multilayer X-Ray Mirrors With The Periods Of Nanometer And Subnanometer Scale

AuthID
 P-00G-90W
9
Author(s)
SALASHCHENKO, NN
·
GAPONOV, SV
·
AKHSAKHALYAN, AD
·
ANDREEV, SS
·
PLATONOV, YY
·
SHAMOV, EA
·
SHINKAREV, SI
·
ZUEV, SA
2
Editor(s)
Hoover, RB; Walker, ABC
Document Type
Proceedings Paper
Year published
1994
Published
in MULTILAYER AND GRAZING INCIDENCE X-RAY/EUV OPTICS II in PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Volume: 2011, Pages: 402-412 (11)
Conference
Conference on Multilayer and Grazing Incidence X-Ray/Euv Optics Ii, Date: JUL 14-16, 1993, Location: SAN DIEGO, CA, Sponsors: SOC PHOTO OPT INSTRUMENTAT ENGINEERS
Indexing
Wos®
Google Scholar®
Publication Identifiers
Wos: WOS:A1994BZ74W00038
Export Publication Metadata
Marked List
 Add to Marked List
Citations
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference
No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2026 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service