Nonlinear Characterization Techniques for Improving Accuracy of Gan Hemt Model Predictions in Rf Power Amplifiers

AuthID
 P-00G-HXD
6
Author(s)
Marante, R
·
Garcia, JA
·
Cabria, L
·
Aballo, T
·
Pedro, JC
Document Type
Proceedings Paper
Year published
2010
Published
in 2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT) in IEEE MTT-S International Microwave Symposium, ISSN: 0149-645X
Pages: 1680-1683 (4)
Conference
Ieee Mtt-S International Microwave Symposium Digest, Date: MAY 23-28, 2010, Location: Anaheim, CA, Sponsors: IEEE
Indexing
Wos®
Publication Identifiers
Wos: WOS:000288196501191
Source Identifiers
ISSN: 0149-645X
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

footer slogan

Useful Links

Get Help

© 2025 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service