Svm Classification of Thickness and Lift-Off Using Transient Eddy Current Oscillation Method

AuthID
 P-00K-PY6
4
Author(s)
Angani, CS
·
Document Type
Proceedings Paper
Year published
2016
Published
in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Volume: 2016-July
Conference
2016 Ieee International Instrumentation and Measurement Technology Conference, I2Mtc 2016, Date: 23 May 2016 through 26 May 2016, Sponsors: IEEE;IEEE Instrumentation and Measurement Society
Indexing
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84980347990
Source Identifiers
ISSN: 1091-5281
Export Publication Metadata
Marked List
 Add to Marked List
Citations
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

CORE Conference
No information about CORE Rank

During the preprocessing phase, only publications of type 'Proceedings Paper' or 'Proceedings' are automatically processed to identify their CORE Rank.

TIP: If your publication's CORE Rank is missing, you can contact with your institutional manager to have the correct ranking manually added to the record.

Journal Factors
Oops! It looks like you don't have access to this content.

This section is restricted to uses with b-on access.

Full Text
Full Text @ sfx.b-on.pt

footer slogan

Useful Links

Get Help

© 2026 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service