Enhanced Analog and Rf Ic Sizing Methodology Using Pca and Nsga-Ii Optimization Kernel

AuthID
 P-00T-EYR
5
Author(s)
Pessoa, T
·
Povoa, R
·
Document Type
Proceedings Paper
Year published
2018
Published
in Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Volume: 2018-January, Pages: 660-665
Conference
2018 Design, Automation and Test in Europe Conference and Exhibition, Date 2018, Date: 19 March 2018 through 23 March 2018, Sponsors: ACM Special Interest Group on Design Automation (SIGDA);Electronic System Design Alliance (ESDA);et al.;European Design and Automation Association (EDAA);European Electronic Chips and Systems Design Initiative (ECSI);IEEE Council on Electronic Design Automation (CEDA)
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Scopus: 2-s2.0-85048842962
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