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Emission-Line Stacking of 21 Cm Intensity Maps with Meerklass: Inference Pipeline and Application to the L-Band Deep-Field Data

AuthID
P-019-M7G

Author(s)

Chen, ZT

Cunnington, S

Pourtsidou, A

Wolz, L

Spinelli, M

Bernal, JL

Barberi-Squarotti, M

Camera, S

Carucci, IP

Fonseca, J

Grainge, K

Irfan, MO

Santos, MG

Wang, JY

Group Author(s)

MeerKLASS Collaboration

Document Type

Article

Year published

2025

Published

in ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES, ISSN: 0067-0049

Volume: 279, Issue: 1, Pages: 19 (30)

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Publication Identifiers

DOI: 10.3847/1538-4365/add897

Scopus: 2-s2.0-105010106781

Wos: WOS:001520270400001

Source Identifiers

ISSN: 0067-0049

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Emission-Line Stacking of 21 Cm Intensity Maps with Meerklass: Inference Pipeline and Application to the L-Band Deep-Field Data

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Emission-Line Stacking of 21 Cm Intensity Maps with Meerklass: Inference Pipeline and Application to the L-Band Deep-Field Data

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